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EN 60444-6:2013

(Main)

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.

Messung von Schwingquarz-Parametern - Teil 6: Messung der Belastungsabhängigkeit (DLD)

Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)

La CEI 60444-6:2013 s'applique aux mesures de la dépendance du niveau d'excitation (DNE) des résonateurs à quartz. Deux méthodes d'essai et une méthode de référence sont décrites. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) La mesure de DNE avec le circuit oscillation utilisait la méthode traditionnelle de détection des modes anormaux DNE au temps présent. Donc, cette méthode fait la transition avec l'Annexe B. b) La grande fiabilité de l'unité de cristal utilisé est nécessaire pour diverses applications actuelles, pour permettre de mettre à jour les capacités d'inspection des modes anormaux des DNE, la méthode de mesure de référence de multi-niveaux a été présentée dans cette spécification.

Meritve parametrov kvarčno-kristalnih enot - 6. del: Merjenje odvisnosti od ravni napajanja

Ta del standarda IEC 60444 se uporablja za merjenje odvisnosti od ravni napajanja (DLD) pri kvarčno-kristalnih enotah. Opisani sta dve preskusni metodi (A in C) in ena referenčna metoda (B). »Metoda A«, ki v skladu s standardom IEC 60444-1 temelji na omrežju π, se lahko uporablja za celotno frekvenčno območje, ki ga pokriva ta del standarda IEC 60444. »Referenčna metoda B«, ki v skladu s standardom IEC 60444-1, IEC 60444-5 ali IEC 60444-8 temelji na omrežju π ali odbojni metodi, se lahko uporablja za celotno frekvenčno območje, ki ga pokriva ta del standarda IEC 60444. »Metoda C«, tj. oscilatorska metoda, je primerna za meritve kristalnih enot v temeljnem načinu v večjih količinah s fiksnimi pogoji.

General Information

Status
Published
Publication Date
03-Oct-2013
Withdrawal Date
23-Jul-2016
ICS
31.140 - Piezoelectric devices
Technical Committee
CLC/SR 49 - Piezoelectric and dielectric devices for frequency control and selection
Drafting Committee
IEC/TC 49 - IEC_TC_49
Current Stage
6060 - Document made available - Publishing
Start Date
04-Oct-2013
Completion Date
04-Oct-2013
Ref Project
SIST EN 60444-6:2014 - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Relations

Replaces
EN 60444-6:1997 - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Effective Date
29-Jan-2023
Replaced By
EN IEC 60444-6:2021 - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Effective Date
12-Oct-2021

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60444-6:2014
01-januar-2014
1DGRPHãþD
SIST EN 60444-6:2002
0HULWYHSDUDPHWURYNYDUþQRNULVWDOQLKHQRWGHO0HUMHQMHRGYLVQRVWLRGUDYQL
QDSDMDQMD
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level
dependence (DLD)
/
Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance
du niveau d'excitation (DNE)
Ta slovenski standard je istoveten z: EN 60444-6:2013
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60444-6:2014 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 60444-6:2014

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SIST EN 60444-6:2014

EUROPEAN STANDARD
EN 60444-6

NORME EUROPÉENNE
October 2013
EUROPÄISCHE NORM

ICS 31.140 Supersedes EN 60444-6:1997


English version


Measurement of quartz crystal unit parameters -
Part 6: Measurement of drive level dependence (DLD)
(IEC 60444-6:2013)


Mesure des paramètres des résonateurs  Messung von Schwingquarz-Parametern -
à quartz - Teil 6: Messung der
Partie 6: Mesure de la dépendance du Belastungsabhängigkeit (DLD)
niveau d'excitation (DNE) (IEC 60444-6:2013)
(CEI 60444-6:2013)




This European Standard was approved by CENELEC on 2013-07-24. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60444-6:2013 E

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SIST EN 60444-6:2014
EN 60444-6:2013 - 2 -
Foreword
The text of document 49/1004/CDV, future edition 2 of IEC 60444-6, prepared by IEC/TC 49,
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 60444-6:2013.
The following dates are fixed:
(dop) 2014-04-24
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2016-07-24

standards conflicting with the
document have to be withdrawn

This document supersedes EN 60444-6:1997.
EN 60444-6:2013 includes the following significant technical changes with respect to
EN 60444-6:1997:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal
modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to
upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference
measurement method was introduced into this specification.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

Endorsement notice
The text of the International Standard IEC 60444-6:2013 was approved by CENELEC as a European
Standard without any modification.

---------------------- Page: 4 ----------------------

SIST EN 60444-6:2014
- 3 - EN 60444-6:2013
Annex ZA
(normative)
Normative references to i nternational publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its applic
...

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