EN 60444-6:1997

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:1995)Messung von Schwingquarz-Kennwerten -- Teil 6: Messung der Belastungsabhängigkeit (DLD)Mesure des paramètres des résonateurs à quartz -- Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)Measurement of quartz crystal unit parameters -- Part 6: Measurement of drive level dependence (DLD)31.140Piezoelectric and dielectric devicesICS:Ta slovenski standard je istoveten z:EN 60444-6:1997SIST EN 60444-6:2002en01-september-2002SIST EN 60444-6:2002SLOVENSKI
STANDARD



SIST EN 60444-6:2002



SIST EN 60444-6:2002



SIST EN 60444-6:2002



SIST EN 60444-6:2002



SIST EN 60444-6:2002



NORMECEIINTERNATIONALEIECINTERNATIONAL444-6STANDARDPremière éditionFirst edition1995-01Mesure des paramètres des résonateursà quartzPartie 6:Mesure de la dépendance du niveaud'excitation (DNE)Measurement of quartz crystal unit parameters —Part 6:Measurement of drive level dependence (DLD)© CEI 1995 Droits de reproduction réservés — Copyright – all rights reservedAucune partie de cette publication ne peut étre reproduite niutilisée sous quelque forme que ce soit et par aucun pro-cédé, électronique ou mécanique, y compris la photocopie etles microfilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized inany form or by any means, electronic or mechanical,including photocopying and microfilm, without permissionin writing from the publisher.Bureau Central de la Commission Electrotechnique Internationale 3, rue de Varembé Genève, SuisseCommission Electrotechnique Internationale CODE PRIXInternational Electrotechnical Commission PRICE CODEMetnayHapoAHae 3netcsparexHH4ecitafi KoMHCCawPour prix, voir catalogue en vigueurFor price, see current catalogueIEC•QSIST EN 60444-6:2002



444-6 © IEC:1995- 3 -CONTENTSPageFOREWORD 5INTRODUCTION 9Clause1General
111.1Scope 111.2 Normative references
112DLD effects 112.1Reversible changes in frequency and resistance
112.2 Irreversible changes in frequency and resistance
112.3 Causes of DLD effects 13Drive levels for DLD measurement
134 Test methods
154.1 Test method A (7r-network method)
154.2 Test method B (oscillator method) 19Annex A - Relationship between electrical drive level and mechanical displacement ofquartz crystal units 31SIST EN 60444-6:2002



444-6 © IEC:1995- 5 -INTERNATIONAL ELECTROTECHNICAL COMMISSIONMEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS —Part 6: Measurement of drive level dependence (DLD)FOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardizationcomprising all national electrotechnical committees (IEC National Committees). The object of the IEC is topromote international cooperation on all questions concerning standardization in the electrical andelectronic fields. To this end and in addition to other activities, the IEC publishes International Standards.Their preparation is entrusted to technical committees; any IEC National Committee interested inthe subject dealt with may participate in this preparatory work. International, governmental andnon-governmental organizations liaising with the IEC also participate in this preparation. The IECcollaborates closely with the International Organization for Standardization (ISO) in accordance withconditions determined by agreement between the two organizations.2)The formal decisions or agreements of the IEC on technical matters, prepared by technical committees onwhich all the National Committees having a special interest therein are represented, express, as nearly aspossible, an international consensus of opinion on the subjects dealt with.3)They have the form of recommendations for international use published in the form of standards, technicalreports or guides and they are accepted by the National Committees in that sense.4)In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.International Standard IEC 444-6 has been prepared by IEC technical committee 49:Piezoelectric and dielectric devices for frequency control and selection.It forms part 6 of a series of publications dealing with the measurement of quartz crystalunit parameters.Part 1: Basic method for the measurement of resonance frequency and resonance resist-ance of quartz crystal units by zero phase technique in a it-network, is issued as IEC 444-1(second edition, 1986).Part 2: Phase offset method for measurement of motional capacitance of quartz crystalunits, is issued as IEC 444-2 (1980).Part 3: Basic method for the measurement of two-terminal parameters of quartz crystalunit
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