SIST EN 60444-11:2011

SLOVENSKI STANDARD
SIST EN 60444-11:2011
01-januar-2011
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Measurement of quartz crystal unit parameters - Part 11: Standard method for the
determination of the load resonance frequency fL and the effective load capacitance
CLeff using automatic network analyzer techniques and error correction (IEC 60444-
11:2010)
Messung von Schwingquarz-Parametern - Teil 11: Standardverfahren zur Bestimmung
der Lastresonanzfrequenz fL und der effektiven Lastkapazität CLeff mit automatischer
Netzwerkanalysatortechnik und Fehlerkorrektur (IEC 60444-11:2010)
Mesure des paramètres des résonateurs à quartz - Partie 11: Méthode normalisée pour
la détermination de la fréquence de résonance à la charge fL et de la capacité de charge
efficace CLeff utilisant des analyseurs automatiques de réseaux et correction des erreurs
(CEI 60444-11:2010)
Ta slovenski standard je istoveten z: EN 60444-11:2010
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60444-11:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60444-11:2011

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SIST EN 60444-11:2011

EUROPEAN STANDARD
EN 60444-11

NORME EUROPÉENNE
November 2010
EUROPÄISCHE NORM

ICS 31.140


English version


Measurement of quartz crystal unit parameters -
Part 11: Standard method for the determination of the load resonance
frequency f and the effective load capacitance C using automatic
L Leff
network analyzer techniques and error correction
(IEC 60444-11:2010)


Mesure des paramètres des résonateurs à Messung von Schwingquarz-Parametern -
quartz - Teil 11: Standardverfahren zur
Partie 11: Méthode normalisée pour la Bestimmung der Lastresonanzfrequenz f
L
détermination de la fréquence de und der effektiven Lastkapazität C mit
Leff
résonance à la charge f et de la capacité automatischer Netzwerkanalysatortechnik
L
de charge efficace C utilisant des
und Fehlerkorrektur
Leff
analyseurs automatiques de réseaux et (IEC 60444-11:2010)
correction des erreurs
(CEI 60444-11:2010)


This European Standard was approved by CENELEC on 2010-11-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60444-11:2010 E

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SIST EN 60444-11:2011
EN 60444-11:2010 - 2 -
Foreword
The text of document 49/852/CDV, future edition 1 of IEC 60444-11, prepared by IEC TC 49,
Piezoelectric, Dielectric and Electrostatic Devices and Associated Materials for Frequency Control,
Selection and Detection, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60444-11 on 2010-11-01.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2011-08-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2013-11-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60444-11:2010 was approved by CENELEC as a European
Standard without any modification.
__________

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SIST EN 60444-11:2011
- 3 - EN 60444-11:2010
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60122-1 2002 Quartz crystal units of assessed quality - EN 60122-1 2002
Part 1: Generic specification


IEC/TR 60444-4 - Measurement of quartz crystal unit EN 60444-4 -
parameters by zero phase technique in a pi-
network -
Part 4: Method for the measurement of the
load resonance frequency fL, load resonance
resistance RL and the calculation of other
derived values of quartz crystal units, up to
30 MHz


IEC 60444-5 1995 Measurement of quartz crystal unit EN 60444-5 1997
parameters -
Part 5: Methods for the determination of
equivalent electrical parameters using
automatic network analyzer techniques and
error correction

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SIST EN 60444-11:2011

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SIST EN 60444-11:2011

IEC 60444-11
®
Edition 1.0 2010-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside


Measurement of quartz crystal unit parameters –
Part 11: Standard method for the determination of the load resonance frequency
f and the effective load capacitance C using automatic network analyzer
L Leff
techniques and error correction

Mesure des paramètres des résonateurs à quartz –
Partie 11: Méthode normalisée pour la détermination de la fréquence de
résonance à la charge f et de la capacité de charge efficace C utilisant des
L Leff
analyseurs automatiques de réseaux et correction des erreurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
N
CODE PRIX
ICS 31.140 ISBN 978-2-88912-210-3
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 60444-11:2011
– 2 – 60444-11 © IEC:2010
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 General concepts .6
3.1 Load resonance frequencies f and f .6
Lr La
3.2 Effective load capacitance C .6
Leff
4 Reference plane and test conditions.7
4.1 General .7
4.2 Principle of measurement .7
4.3 Evaluation of errors .10
Bibliography.14

Figure 1 – Admittance of a quartz crystal unit .6
Figure 2 – X as a function of frequency (solid line) in the vicinity of f .9
C L
Figure 3 – Level of drive of a crystal in a π-network vs. frequency .9
Figure 4 – Error of the load resonance frequency due to the inaccuracy of the
measured voltages (dashed line) and the calibration resistances (soft line) .11
Figure 5 – C -error resulting from f error (due to inaccuracy of the measured voltages
L L
and the calibration resistances) for the same crystal as in Figure 4.11
Figure 6 – Frequency error due to noise of the measured voltages .12
Figure 7 – Error of load resonance frequency f at 30 pF and 10 pF for typical
L
equivalent parameters of quartz crystal units .12
Figure 8 – Error of C for typical equivalent parameters of quartz crystal units .13
Leff

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SIST EN 60444-11:2011
60444-11 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 11: Standard method for the determination of the load resonance
frequency f and the effective load capacitance C using automatic
L Leff
network analyzer techniques and error correction


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-11 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
The text of this standard is based on the following documents:
CDV Report on voting
49/852/CDV 49/883/RVC

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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SIST EN 60444-11:2011
– 4 – 60444-11 © IEC:2010
A list of all parts of the IEC 60444 series under the general title Measurement of quartz crystal
unit parameters can be found on the IEC website.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

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SIST EN 60444-11:2011
60444-11 © IEC:2010 – 5 –
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 11: Standard method for the deter
...