ISO/DIS 20579-1
(Main)Surface chemical analysis -- Guidelines to sample handling, preparation and mounting
Surface chemical analysis -- Guidelines to sample handling, preparation and mounting
Analyse chimique des surfaces -- Lignes directrices pour la manipulation, préparation et montage des échantillons
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DRAFT INTERNATIONAL STANDARD
ISO/DIS 20579-1
ISO/TC 201/SC 2 Secretariat: ANSI
Voting begins on: Voting terminates on:
2017-08-01 2017-10-23
Surface chemical analysis — Guidelines to sample
handling, preparation and mounting —
Part 1:
Guidelines to handling of specimens prior to analysis
Titre manque —
Partie 1: Titre manque
ICS: 71.040.40
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
THEREFORE SUBJECT TO CHANGE AND MAY
NOT BE REFERRED TO AS AN INTERNATIONAL
STANDARD UNTIL PUBLISHED AS SUCH.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL,
This document is circulated as received from the committee secretariat.
TECHNOLOGICAL, COMMERCIAL AND
USER PURPOSES, DRAFT INTERNATIONAL
STANDARDS MAY ON OCCASION HAVE TO
BE CONSIDERED IN THE LIGHT OF THEIR
POTENTIAL TO BECOME STANDARDS TO
WHICH REFERENCE MAY BE MADE IN
Reference number
NATIONAL REGULATIONS.
ISO/DIS 20579-1:2017(E)
RECIPIENTS OF THIS DRAFT ARE INVITED
TO SUBMIT, WITH THEIR COMMENTS,
NOTIFICATION OF ANY RELEVANT PATENT
RIGHTS OF WHICH THEY ARE AWARE AND TO
PROVIDE SUPPORTING DOCUMENTATION. ISO 2017
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ISO/DIS 20579-1:2017(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2017, Published in Switzerland
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ii © ISO 2017 – All rights reserved
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ISO/DIS 20579-1:2017(E)
Contents Page
Foreword ........................................................................................................................................................................................................................................iv
Introduction ..................................................................................................................................................................................................................................v
1 Scope ................................................................................................................................................................................................................................. 1
2 Normative references ...................................................................................................................................................................................... 1
3 Terms and definitions ..................................................................................................................................................................................... 1
4 Symbols and abbreviated terms ........................................................................................................................................................... 1
5 Explanation of Structure of this Standard .................................................................................................................................. 1
6 General Requirements and Classes of Specimen ................................................................................................................ 2
7 Specimen Influences ......................................................................................................................................................................................... 4
7.1 Specimen Information needed by analyst ....................................................................................................................... 4
7.2 History ............................................................................................................................................................................................................ 4
7.3 Handling of samples with respect to other analytical techniques .............................................................. 4
7.4 Identification of specimens .......................................................................................................................................................... 5
7.5 Precautions ................................................................................................................................................................................................ 5
8 Sources of Specimen Contamination in Handling .............................................................................................................. 5
9 Specimen Storage and Transfer ............................................................................................................................................................ 6
9.1 Storage ........................................................................................................................................................................................................... 6
9.1.1 Time ............................................................................................................................................................................................ 6
9.1.2 Containers.............................................................................................................................................................................. 6
9.1.3 Temperature and Humidity .................................................................................................................................... 7
9.2 Descriptive List of Containers .................................................................................................................................................... 7
10 Information on Specimen History ...................................................................................................................................................... 8
11 Education of Specimen Owner on Appropriate Specimen Handling Procedures .............................8
Bibliography ................................................................................................................................................................................................................................ 9
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ISO/DIS 20579-1:2017(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2. www .iso .org/ directivesAttention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received. www .iso .org/ patentsAny trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical
Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information
The committee responsible for this document is ISO/TC 201.This multi-part standard replaces ISO standards 18116 and 18117.
iv © ISO 2017 – All rights reserved
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ISO/DIS 20579-1:2017(E)
Introduction
Common Introduction
This International Standard is intended to assist analysts and those seeking surface chemical analysis
in the handling, storage, mounting and treatment of specimens. This is a multipart document, with the
first two parts being general requirements for sample handling and storage in ISO 20579-1: Part 1,
and mounting and treatment of samples in ISO 20579-2: Part 2. The ensuing parts combine any new
requirements of sample handling/storage and/or sample mounting/preparation for new materials
classes. Part 3 focuses on biomaterials and Part 4 focuses on reporting needs for nano-objects. Each
part of this international standard can be used independently of the other parts although, the general
procedures described in Parts 1 and 2 are applicable to a wide range of materials and are not reproduced
in the materials specific sections.Although primarily prepared for the surface-analysis techniques of Auger electron spectroscopy (AES),
X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS), the methods
described in this International Standard will also be applicable to many other surface-sensitive
analytical techniques such as ion-scattering spectrometry, scanning probe microscopy, low-energy
electron diffraction and electron energy-loss spectroscopy, where specimen handling can influence
surface-sensitive measurements. AES, XPS and SIMS are sensitive to surface layers that are typically
a few nanometers in thickness. Such thin layers may be subject to severe perturbations caused by
specimen handling or surface treatments that may be necessary prior to introduction into the analytical
chamber. Proper handling and preparation of specimens is particularly critical for dependable analysis.
Improper handling of specimens can result in alteration of the surface composition and unreliable data.
Part 1 IntroductionThis part of the standard is intended for the specimen owner or the purchaser of surface analytical
services and for the surface analyst. The optimum handling procedures are dependent on the particular
specimen and the needed information, and this document provides illustrative examples for each
specimen type that a specimen owner and surface analyst will typically encounter. It is recommended
that the specimen supplier consult the surface analyst as soon as possible with regard to specimen
history, the specific problem to be solved or information needed, and any particular specimen
preparation, handling or shipping procedures required.Parts of this ISO Standard are based on ASTM/Standard E 1829, Standard Guide for Handling Samples
[3]Prior to Surface Analysis, copyright ASTM. Reprinted with permission of ASTM.
[4]
This part can be used independently of part 2, which gives guidance to the analyst for specimen
preparation and mounting for surface analysis.© ISO 2017 – All rights reserved v
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DRAFT INTERNATIONAL STANDARD ISO/DIS 20579-1:2017(E)
Surface chemical analysis — Guide to sample handling,
preparation and mounting —
Part 1:
Guidelines to handling of specimens prior to analysis
1 Scope
This International Standard gives guidance on the handling of and the containers for specimens
submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid
in understanding the special sample handling requirements of surface chemical analysis techniques,
particularly: Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), and X-ray
photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable for other
analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances,
with particular specimens, further precautions may be necessary.2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
ISO 18115, Surface Chemical Analysis — Vocabulary.3 Terms and definitions
[5]
For the purposes of this document, the terms and definitions given in ISO 18115 apply.
4 Symbols and abbreviated termsAES Auger electron spectroscopy
AFM atomic force microscopy
ESCA electron spectroscopy for chemical analysis
PTFE polytetrafluoroethylene
SEM scanning electron microscopy
SIMS secondary ion mass spectrometry
TXRF total reflection X-ray fluorescence spectroscopy
XPS X-ray photoelectron spectroscopy:
5 Explanation of Structure of this Standard
Section 6 discusses additional considerations, such as specimen history and previous analyses of
the specimen, that affect the composition of the surface. Documentation of these influences should
accompany the carefully handled and packaged specimen when submitted for analysis. Section
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ISO/DIS 20579-1:2017(E)
7 provides specific recommendations on specimen handling procedures necessary to minimize
contamination of the specimen surface. Moreover, Section 7 gives a series of alternative specimen
handling procedures based on maintaining increasing degrees of specimen cleanliness during handling
and transfer of the specimen to storage containers. Section 8 describes different specimen containers
that may be used in different conditions. Section 8 also discusses specimen storage with respect to
time, humidity, and temperature. Sections 9 and 10 emphasize that specimen handling has an effect
on the information derived from surface analytical measurements, and that specimen owners as well
as analysts will benefit from improved analyses when prescribed specimen handling protocols are
followed.6 General Requirements and Classes of Specimen
6.1 The degree of cleanliness required by surface-sensitive analytical techniques is much greater than
for many other forms of analysis.6.2 Specimens shall never be in contact with the bare hand. Contact of the surface area to be analysed
with handling tools or other equipment shall be eliminated or minimized whenever possible.
6.3 Specimens shall be transported to the analyst in a container that does not come into direct contact
with the surface of interest.6.4 In many cases, the analysis will be performed on the “as received” specimen; surface contamination
or atmospheric adsorbates are not then usually removed because they are the item of interest. Care shall
be taken in the handling of these specimens to ensure that nothing, apart from air or clean inert gases,
comes in contact with the surface to be investigated. In particular, avoid contacting the specimen surface
with solvents or cleaning solutions, gases such as compressed air or solvent vapours, metals, tissue or
other wrapping materials, tape, cloth, tools, packing materials, or the walls of containers. In cases where
these precautions are not feasible due to the size of the specimen, some alternative specimen handling
and transporting methods are presented in sections 8.2i, 8.2j, and 8.2k.6.5 In some cases, it may be necessary to take a representative sample from the specimen. Selection of
a smaller sample from a larger specimen should be done after considering the information being sought
because inhomogeneities are often present. It is recommended that this choice be made in consultation
with an experienced analyst. Specific care should be taken to avoid contaminating the surface of interest
during the cutting procedure (see ISO 18116).6.6 Special caution shall be exercised with specimens containing potential toxins or other hazardous
materials. Whenever possible, chemical hazard data sheets should be supplied with the specimen.
6.7 The severity of the requirement for careful handling varies dramatically with the condition of the
surface, the depth from the surface of the information being sought, and the detection level required
for the material being analyzed. The following list arranges specimens by their decreasing sensitivity to
handling. This list is partly recreated in columns 1 and 2 of Table 1.a) Reactive specimens where the reactive surface is to be analyzed.
b) Specimens with hydrocarbons, molecular films, or biomaterials on the surface that are the object of
analysis.c) Specimens with a contamination layer that is the object of analysis.
d) Specimens that have been exposed to the atmosphere and that are to be analyzed “as received.”
e) Specimens with atmospheric adsorbates that may interfere with analysis.2 © ISO 2017 – All rights reserved
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ISO/DIS 20579-1:2017(E)
f) Specimens with a contamination layer (or other topmost layer) that is of no interest and that will
be removed just prior to insertion in the analytical chamber (e.g., treatment by solutions, abrasion,
plasma, exposure to radiation, etc.).g) Specimens with a contamination layer (or other topmost layer) that is of no interest and that will be
removed in the analytical chamber.h) Thin films that will be delaminated by the analyst prior to insertion into the analysis chamber.
i) Specimens that will be fractured or freshly prepared outside the analysis chamber, including
materials prepared in a controlled atmosphere.j) Uniform thin films that are to be removed by ion etching or scraping in the analysis chamber to
expose a layer or interface of interest.k) Samples that will be fractured in situ.
l) Bulk materials where the information sought is on bulk properties.
6.8 Information Sought
6.81 Surface chemical analysis can be performed on a wide range of specimens and can be used to
obtain very different types of information about surfaces or interfaces. The degree of care that shall be
taken depends upon the type of analysis that is required and the nature of the problem. The information
being sought usually falls into three general categories: (A) information requiring integrity of the
outermost surface...
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