Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

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Corrigendum 2 - Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour les appareils à courant d’entrée inférieur ou égal à 16 A par phase

General Information

Status
Published
Publication Date
12-Oct-2022
Current Stage
PPUB - Publication issued
Start Date
30-Nov-2022
Completion Date
13-Oct-2022
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IEC 61000-4-11:2020/COR2:2022 - Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase Released:10/13/2022
English and French language
2 pages
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Standards Content (Sample)

IEC 61000-4-11:2020/COR2:2022 – 1 –
 IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________

IEC 61000-4-11 IEC 61000-4-11
Edition 3.0  2020-01 Édition 3.0  2020-01


ELECTROMAGNETIC COMPATIBILITY (EMC) – COMPATIBILITE ELECTROMAGNETIQUE (CEM) –

Part 4-11: Testing and measurement Partie 4-11: Techniques d'essai et de mesure –
techniques – Voltage dips, short interruptions Essais d'immunité aux creux de tension,
and voltage variations immunity tests for coupures brèves et variations de tension pour
equipment with input current up to 16 A les appareils à courant d’entrée inférieur
per phase ou égal à 16 A par phase


CO RRI G E NDUM 2



Corrections to the French version appear after the English text.
Les corrections à la version française sont données après le texte anglais.

5.3 Voltage variations (optional)
Replace the heading, as modified by Corrigendum 1, with the following new heading:
5.3 Voltage variations

7 Test set-up
Replace the second paragraph with the following new paragraph:
The test set-ups are defined fo
...

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