iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
CLC

EN 60679-4:1998

(Main)

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval

IEC 60679-4:1997 applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification, IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.

Quarzoszillatoren mit bewerteter Qualität - Teil 4: Rahmenspezifikation - Befähigungsanerkennung

Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 4: Spécification intermédiaire - Agrément de savoir-faire

IEC 60679-4:1997 s'applique à des oscillateurs pilotés par quartz; ceux-ci sont fabriqués à la demande ou sont des articles standards sur catalogue et leur qualité est évaluée sur la base de l'agrément de savoir-faire. Elle prescrit les caractéristiques et valeurs préférentielles accompagnées des essais appropriés et méthodes de mesures contenus dans la spécification générique, IEC 60679-1. Par ailleurs, y figurent les exigences de performance générales qui doivent être employées dans les spécifications particulières pour les oscillateurs pilotés par quartz.

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997)

General Information

Status
Published
Publication Date
19-Feb-1998
Withdrawal Date
30-Apr-2010
ICS
31.140 - Piezoelectric devices
Technical Committee
CLC/SR 49 - Piezoelectric and dielectric devices for frequency control and selection
Drafting Committee
IEC/TC 49 - IEC_TC_49
Parallel Committee
IEC/TC 49 - IEC_TC_49
Current Stage
6060 - Document made available - Publishing
Start Date
20-Feb-1998
Completion Date
20-Feb-1998
Ref Project
SIST EN 60679-4:2002 - Quartz crystal controlled oscillators of assessed quality -- Part 4: Sectional specification - Capability approval

Relations

Replaces
EN 169100:1993 - Sectional Specification: Quartz crystal controlled oscillators (Capability approval)
Effective Date
29-Jan-2023

Buy Standard

EN 60679-4:2002EN 60679-4:2002
PreviousNext
Standard
EN 60679-4:2002
English language
33 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 60679-4:2002
01-september-2002
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional
specification - Capability approval (IEC 60679-4:1997)
Quartz crystal controlled oscillators of assessed quality -- Part 4: Sectional specification -
Capability approval
Quarzoszillatoren mit bewerteter Qualität -- Teil 4: Rahmenspezifikation -
Befähigungsanerkennung
Oscillateurs pilotés par quartz sous assurance de la qualité -- Partie 4: Spécification
intermédiaire - Agrément de savoir-faire
Ta slovenski standard je istoveten z: EN 60679-4:1998
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60679-4:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 60679-4:2002

---------------------- Page: 2 ----------------------

SIST EN 60679-4:2002

---------------------- Page: 3 ----------------------

SIST EN 60679-4:2002

---------------------- Page: 4 ----------------------

SIST EN 60679-4:2002

---------------------- Page: 5 ----------------------

SIST EN 60679-4:2002

---------------------- Page: 6 ----------------------

SIST EN 60679-4:2002
NORME
CEI
INTERNATIONALE
IEC
60679-4
INTERNATIONAL
QC 690100
STANDARD
Première édition
First edition
1997-12
Oscillateurs pilotés par quartz sous assurance
de la qualité –
Partie 4:
Spécification intermédiaire –
Agrément de savoir-faire
Quartz crystal controlled oscillators
of assessed quality –
Part 4:
Sectional specification – Capability approval
 IEC 1997 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE U
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

---------------------- Page: 7 ----------------------

SIST EN 60679-4:2002
60679-4  IEC:1997 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General. 9
1.1 Scope . 9
1.2 Normative references. 9
2 Preferred values for ratings and guidance on detail specifications. 9
2.1 Preferred values for ratings and characteristics . 9
2.2 Information to be prescribed in detail specifications . 11
3 Capability approval. 13
3.1 Eligibility for capability approval. 13
3.2 Structural similarity . 13
3.3 Procedures for capability approval. 13
3.4 Capability manual. 15
3.5 Capability qualifying components (CQC). 15
3.6 Inspection requirements for CQCs. 19
3.7 Programme for capability approval . 19
3.8 Capability approval report. 19
3.9 Abstract of description of capability approval . 19
3.10 Modifications likely to affect the capability approval . 21
3.11 Initial capability approval . 21
3.12 Maintenance of capability approval . 49
3.13 Rework and repair work.
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.

This May Also Interest You

CLC
EN IEC 62604-2:2022(Main)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
SIST EN IEC 62604-2:2022

IEC 62604-2:2022 is available as IEC 62604-2:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition: - the term "cross-isolation" has been added to Clause 3; - multiplexers are described. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.

  • Standard
    29 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62604-1:2022(Main)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
SIST EN IEC 62604-1:2022

IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition: - the term "multiplexer" has been added to Clause 3. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.

  • Standard
    37 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 63041-1:2021(Main)
Piezoelectric sensors - Part 1: Generic specifications
SIST EN IEC 63041-1:2022

This part of IEC 63041 applies to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state-of-art piezoelectric sensors and how to use them correctly.

  • Standard
    33 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 60444-6:2021(Main)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
SIST EN IEC 60444-6:2021

This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture).

  • Standard
    23 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 61837-2:2018/A1:2020(Amendment)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
SIST EN IEC 61837-2:2018/A1:2021
  • Amendment
    26 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 63041-3:2020(Main)
Piezoelectric sensors - Part 3: Physical sensors
SIST EN IEC 63041-3:2020

IEC 63041-3:2020 is applicable to piezoelectric physical sensors mainly used in the field of process control, wireless monitoring, dynamics, thermodynamics, vacuum engineering, and environmental sciences. This document provides users with technical guidelines as well as basic knowledge of common physical sensors. Piezoelectric sensors covered herein are those applied to the detection and measurement of physical quantities such as force, pressure, torque, viscosity, temperature, film thickness, acceleration, vibration, and tilt angle.

  • Standard
    16 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 63155:2020(Main)
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
SIST EN IEC 63155:2020

IEC 63155:2020 defines the measurement method for the determination of the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, with respect to high power RF signals, which are used in telecommunications, measuring equipment, radar systems and consumer products. RF BAW devices include two types: those based on the film bulk acoustic resonator (FBAR) technology and those based on the solidly mounted resonator (SMR) technology. This document includes basic properties of failure of RF SAW/BAW devices, and guidelines to set up the measurement system and to establish the procedure to estimate the time to failure (TF). Since TF is mainly governed by the RF power applied in the devices, discussions are focused on the power durability. It is not the aim of this document to explain the theory, or to attempt to cover all the eventualities which can arise in practical circumstances. This document draws attention to some of the more fundamental questions which will need to be considered by the user before he/she places an order for an RF SAW/BAW device for a new application. Such a procedure will be the user's means of preventing unsatisfactory performance related to premature device failure resulting from high-power exposure of RF SAW/BAW devices.

  • Standard
    23 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62884-4:2019(Main)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
SIST EN IEC 62884-4:2019

IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.

  • Standard
    23 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 60122-4:2019(Main)
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
SIST EN IEC 60122-4:2019

This part of IEC 60122 is applicable to crystal units with thermistors mainly used in the field of mobile communication that requires high frequency stability such as local reference signal generator for the mobile phone base station or GPS. This document provides users with technical guidelines of crystal units with thermistors as well as basic knowledge of common crystal units with thermistors.

  • Standard
    17 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 61837-2:2018(Main)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
SIST EN IEC 61837-2:2018

IEC 61837-2:2018(E) deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is based on IEC 61240:2016. This edition includes the following significant technical changes with respect to the previous edition: a. revision of the figures to match the notation of the drawings of IEC 61240:2016; b. addition of 7 enclosures as follows: DCC-6/5032A, DCC-6/3225A, DCC-4/3215C, DCC-6/2016A, DCC-2/2012C, DCC-2/1610C, DCC-4/1210C. As a result, this third edition contains a total of 45 enclosure types, which are listed in Table 1.

  • Standard
    102 pages
    English language
    sale 10% off
    e-Library read for
    1 day